1/f noise in nanowires

Bid, Aveek ; Bora, Achyut ; Raychaudhuri, A. K. (2006) 1/f noise in nanowires Nanotechnology, 17 (1). pp. 152-156. ISSN 0957-4484

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Official URL: http://iopscience.iop.org/0957-4484/17/1/024

Related URL: http://dx.doi.org/10.1088/0957-4484/17/1/024

Abstract

We have measured the low-frequency resistance fluctuations (1mHz<f<10 Hz) in Ag nanowires of diameter 15 nm≤d≤ 200 nm at room temperature. The power spectral density (PSD) of the fluctuations has a 1/fα character as seen in metallic films and wires of larger dimension. Additionally, the PSD has a significant low-frequency component and the value of α increases from the usual 1 to ≃3/2 as the diameter d is reduced. The value of the normalized fluctuation (<ΔR2>/R2) also increases as the diameter d is reduced. We observe that there are new features in the 1/f noise as the size of the wire is reduced and they become more prominent as the diameter of the wires approaches 15 nm. It is important to investigate the origin of the new behaviour as 1/f noise may become a limiting factor in the use of metal wires of nanometre dimensions as interconnects.

Item Type:Article
Source:Copyright of this article belongs to Institute of Physics.
ID Code:42570
Deposited On:04 Jun 2011 11:51
Last Modified:17 May 2016 23:49

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