Items where Author is "Yeo, Chia Ching"
Group by: Item Type | No Grouping Jump to: Article Number of items: 1. ArticleMaji, Debabrata ; Duttagupta, S. P. ; Rao, V. R. ; Yeo, Chia Ching ; Cho, Byung-Jin (2007) Border-trap characterization in high-κ strained-Si MOSFETs IEEE Electron Device Letters, 28 (8). pp. 731-733. ISSN 0741-3106 |
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