Items where Author is "Rao, Rakesh"

Article

Mishra, Subrat ; Wong, Hiu Yung ; Tiwari, Ravi ; Chaudhary, Ankush ; Rao, Rakesh ; Moroz, Victor ; Mahapatra, Souvik (2016) TCAD-based predictive NBTI framework for sub-20-nm node device design considerations IEEE Transactions on Electron Devices, 63 (12). pp. 4624-4631. ISSN 0018-9383

Conference or Workshop Item

Mishra, Subrat ; Wong, Hiu Yung ; Tiwari, Ravi ; Chaudhary, Ankush ; Parihar, Narendra ; Rao, Rakesh ; Motzny, Steve ; Moroz, Victor ; Mahapatra, Souvik (2017) Predictive TCAD for NBTI stress-recovery in various device architectures and channel materials In: 2017 IEEE International Conference on Reliability Physics Symposium (IRPS), 2-6 April 2017, Monterey, CA, USA.

Parihar, Narendra ; Sharma, Uma ; Mukhopadhyay, Subhadeep ; Goel, Nilesh ; Chaudhary, Ankush ; Rao, Rakesh ; Mahapatra, Souvik (2017) Resolution of disputes concerning the physical mechanism and DC/AC stress/recovery modeling of Negative Bias Temperature Instability (NBTI) in p-MOSFETs In: 2017 IEEE International Conference on Reliability Physics Symposium (IRPS), 2-6 April 2017, Monterey, CA, USA.