Items where Author is "Ramgopal Rao, V."

Article

Khaderbad, Mrunal A. ; Pandharipande, Rohit ; Singh, Vibhas ; Madhu, Sheri ; Ravikanth, M. ; Ramgopal Rao, V. (2012) Porphyrin self-assembled monolayer as a copper diffusion barrier for advanced CMOS technologies IEEE Transactions on Electron Devices, 59 (7). pp. 1963-1969. ISSN 0018-9383

Navan, Ramesh R. ; Panigrahy, Bharati ; Shojaei Baghini, M. ; Bahadur, D. ; Ramgopal Rao, V. (2012) Mobility enhancement of solution-processed Poly(3-Hexylthiophene) based organic transistor using zinc oxide nanostructures Composites Part B: Engineering, 43 (3). pp. 1645-1648. ISSN 1359-8368

Khaderbad, Mrunal A. ; Choi, Youngjin ; Hiralal, Pritesh ; Aziz, Atif ; Wang, Nan ; Durkan, Colm ; Thiruvenkatanathan, Pradyumna ; Amaratunga, Gehan A. J. ; Ramgopal Rao, V. ; Seshia, Ashwin A. (2012) Electrical actuation and readout in a nanoelectromechanical resonator based on a laterally suspended zinc oxide nanowire Nanotechnology, 23 (2). No pp. given. ISSN 0957-4484

Prashanthi, K. ; Naresh, M. ; Seena, V. ; Thundat, T. ; Ramgopal Rao, V. (2011) A novel photoplastic piezoelectric nanocomposite for MEMS applications IEEE/ASME Journal of Microelectromechanical Systems, PP (99). pp. 1-3. ISSN 1057-7157

Surya, Sandeep ; Nag, Sudip ; Fernandes, Avil J. ; Gandhi, Sahir ; Agarwal, Dilip ; Chatterjee, Gaurav ; Ramgopal Rao, V. (2011) Highly sensitive R/R measurement system for nano-electro-mechanical cantilever based bio-sensors IEEE International Symposium on Electronic System Design (ISED) . pp. 34-38.

Gilda, Neena A. ; Patil, Sheetal ; Seena, V. ; Joshi, Sanjay ; Thaker, Viral ; Thakur, Sanket ; Anvesha, A. ; Shojaei Baghini, M. ; Sharma, D. K. ; Ramgopal Rao, V. (2011) Piezoresistive 6-MNA coated microcantilevers with signal conditioning circuits for electronic nose Proceedings of the IEEE Asian Solid-State Circuits Conference (A-SSCC) 2011, Jeju, Korea . pp. 121-124.

Seena, V. ; Fernandes, Avil ; Pant, Prita ; Mukherji, Soumyo ; Ramgopal Rao, V. (2011) Polymer nanocomposite nanomechanical cantilever sensors: material characterization, device development and application in explosive vapour detection Nanotechnology, 22 (29). 295501_1-295501_11. ISSN 0957-4484

Seena, V. ; Dudhe, Ravishankar S. ; Raval, Harshil N. ; Patil, Sheetal ; Kumar, Anil ; Mukherji, Soumyo ; Ramgopal Rao, V. (2011) Organic sensor platforms for environmental and security applications Electro-Chemical-Society (ECS) Transactions, 35 (3). pp. 67-77. ISSN 1938-5862

Thakker, Rajesh A. ; Srivastava, Mayank ; Tailor, Ketankumar H. ; Baghini, Maryam Shojaei ; Sharma, Dinesh K. ; Ramgopal Rao, V. ; Patil, Mahesh B. (2011) A novel architecture for improving slew rate in FinFET-based op-amps and OTAs Microelectronics Journal, 42 (5). pp. 758-765. ISSN 0026-2692

Shrivastava, M. ; Agrawal, M. ; Aghassi, J. ; Gossner, H. ; Molzer, W. ; Schulz, T. ; Ramgopal Rao, V. (2011) On the thermal failure in nanoscale devices: insight towards heat transport including critical BEOL and design guidelines for robust thermal management & EOS/ESD reliability 2011 IEEE International Reliability Physics Symposium (IRPS) . 3F.3_1-3F.3_5. ISSN 1541-7026

Tsutsui, Kazuo ; Kobayashi, Yusuke ; Kakushima, Kuniyuki ; Ahmet, Parhat ; Ramgopal Rao, V. ; Iwai, Hiroshi (2011) Analysis of threshold voltage variations in fin field effect transistors Key Engineering Materials, 470 . pp. 194-200. ISSN 1013-9826

Raval, Harshil N. ; Ramgopal Rao, V. (2011) Ionizing radiation total dose detectors using oligomer organic semiconductor material and devices MRS Proceedings, 1312 . pp. 1-6. ISSN 1946-4274

Prashanthi, K. ; Mandal, M. ; Duttagupta, S. P. ; Ramgopal Rao, V. ; Pant, P. ; Dhale, K. ; Palkar, V. R. (2011) Nanochanical characterization of multiferroic thin films for micro-electromechanical systems International Journal of Nanoscience, 10 (4). pp. 1039-1043. ISSN 0219-581X

Kumar, Anshuman ; Navan, Ramesh R. ; Kushwaha, Ajay ; Aslam, M. ; Ramgopal Rao, V. (2011) Performance enhancement of p-type organic thin film transistors using zinc oxide nanostructures International Journal of Nanoscience, 10 (4-5). pp. 761-764. ISSN 0219-581X

Seena, V. ; Fernandes, Avil ; Mukherji, Soumyo ; Ramgopal Rao, V. (2011) Photoplastic microcantilever sensor platform for explosive detection International Journal of Nanoscience, 10 (4-5). pp. 739-743. ISSN 0219-581X

Dudhe, Ravishankar S. ; Sinha, Jasmine ; Sutar, D. S. ; Kumar, Anil ; Ramgopal Rao, V. (2011) Poly (3-hexylthiophene) and hexafluoro-2-propanol-substituted polysiloxane based OFETs as a sensor for explosive vapor detection Sensors and Actuators A: Physical . ISSN 0924-4247

Joshi, Manoj ; Ramgopal Rao, V. ; Mukherji, Soumyo (2010) A novel technique for microfabrication of ultra-thin affinity cantilevers for characterization with an AFM Journal of Micromechanics and Microengineering, 20 (12). p. 125007. ISSN 0960-1317

Chabukswar, S. ; Maji, D. ; Manoj, C. R. ; Anil, K. G. ; Ramgopal Rao, V. ; Crupi, F. ; Magnone, P. ; Giusi, G. ; Pace, C. ; Collaert, N. (2010) Implications of fin width scaling on variability and reliability of high-k metal gate FinFETs Microelectronic Engineering, 87 (10). pp. 1963-1967. ISSN 0167-9317

Dudhe, Ravishankar S. ; Sinha, Jasmine ; Kumar, Anil ; Ramgopal Rao, V. (2010) Polymer composite-based OFET sensor with improved sensitivity towards nitro based explosive vapors Sensors and Actuators B: Chemical, 148 (1). pp. 158-165. ISSN 0925-4005

Shrivastava, M. ; Bychikhin, S. ; Pogany, D. ; Schneider, J. ; Shojaei Baghini, M. ; Gossner, H. ; Gornik, E. ; Ramgopal Rao, V. (2010) On the differences between 3D filamentation and failure of N & P type drain extended MOS devices under ESD condition IEEE International Reliability Physics Symposium (IRPS), 2010 . pp. 480-484. ISSN 1541-7026

Sachid, A. B. ; Thakker, R. A. ; Sathe, C. ; Baghini, M. S. ; Sharma, D. K. ; Ramgopal Rao, V. ; Patil, M. B. (2010) Auto-BET-AMS: an automated device and circuit optimization platform to benchmark emerging technologies for performance and variability using an analog and mixed-signal design framework Proceedings of the 11th International Symposium on Quality Electronic Design (ISQED 2010) . pp. 713-720. ISSN 1948-3287

Kobayashi, Yusuke ; Kakushima, Kuniyuki ; Ahmet, Parhat ; Ramgopal Rao, V. ; Tsutsui, Kazuo ; Iwai, Hiroshi (2010) Analysis of dependence of short-channel effects in double-gate MOSFETs on channel thickness Microelectronics Reliability, 50 (3). pp. 332-337. ISSN 0026-2714

Prashanthi, K. ; Mandal, M. ; Duttagupta, S. P. ; Pant, Prita ; Palkar, V. R. ; Ramgopal Rao, V. (2010) Characterization of multiferroic thin films directly deposited on silicon for novel device applications Proceedings of the 2010 IEEE International NanoElectornics Conference, Hong Kong, China . pp. 900-901.

Kobayashi, Yusuke ; Tsutsui, Kazuo ; Kakushima, Kuniyuki ; Ahmet, Parhat ; Ramgopal Rao, V. ; Iwai, Hiroshi (2010) Analysis of threshold voltage variation in fin field effect transistors: separation of short channel effects Japanese Journal of Applied Physics, 49 . 044201_1-044201_6. ISSN 0021-4922

Asra, Ram ; Murali, Kota V. R. M. ; Ramgopal Rao, V. (2010) A binary tunnel field effect transistor with a steep sub-threshold swing and increased ON current Japanese Journal of Applied Physics, 49 (12). 120203_1-120203_3. ISSN 0021-4922

Shrivastava, M. ; Schneider, J. ; Jain, R. ; Baghini, M. S. ; Gossner, H. ; Ramgopal Rao, V. (2009) IGBT plugged in SCR device for ESD protection in advanced CMOS technology 31st IEEE Annual InternationaEOS/ESD Symposium, Anaheim, CA, USA . pp. 1-9.

Hariharan, Venkatnarayan ; Thakker, Rajesh ; Singh, Karmvir ; Sachid, Angada B. ; Patil, M. B. ; Vasi, Juzer ; Ramgopal Rao, V. (2009) Drain current model for nanoscale double-gate MOSFETs Solid-State Electronics, 53 (9). pp. 1001-1008. ISSN 0038-1101

Seena, V. ; Rajorya, Anukool ; Pant, Prita ; Mukherji, Soumyo ; Ramgopal Rao, V. (2009) Polymer microcantilever biochemical sensors with integrated polymer composites for electrical detection Solid State Sciences, 11 (9). pp. 1606-1611. ISSN 1293-2558

Kale, Nitin S. ; Joshi, Manoj ; Nageswara Rao, P. ; Mukherji, S. ; Ramgopal Rao, V. (2009) Bio-functionalization of silicon nitride-based piezo-resistive microcantilevers Sadhana (Academy Proceedings in Engineering Sciences), 34 (4). pp. 591-597. ISSN 0256-2499

Thakker, R. A. ; sathe, C. ; Sachid, A. B. ; Shojaei Baghini, M. ; Ramgopal Rao, V. ; Patil, M. B. (2009) A novel table-based approach for design of FinFET circuits IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 28 (7). pp. 1061-1070. ISSN 0278-0070

Govindarajan, A. V. ; Paluri, S. ; Sharma, A. ; Ramgopal Rao, V. ; Bohringer, K. F. (2009) Selective vapor-liquid-solid growth of needle arrays by hotwire chemical vapor deposition with low substrate temperature TRANSDUCERS'09: The 15th International Conference on Solid-State Sensors, Actuators and Microsystems, Denver, Colorado USA . pp. 1079-1082.

Raval, Harshil N. ; Tiwari, Shree Prakash ; Navan, Ramesh R. ; Ramgopal Rao, V. (2009) Determining ionizing radiation using sensors based on organic semiconducting material Applied Physics Letters, 94 (12). 123304_1-123304_3. ISSN 0003-6951

Hariharan, Venkatnarayan ; Vasi, Juzer ; Ramgopal Rao, V. (2009) A CAD-compatible closed form approximation for the inversion charge areal density in double-gate MOSFETs Solid-State Electronics, 53 (2). pp. 218-224. ISSN 0038-1101

Walawalkar, Mrinalini G. ; Kottantharayil, Anil ; Ramgopal Rao, V. (2009) Chemical vapor deposition precursors for high dielectric oxides: zirconium and hafnium oxide Synthesis and Reactivity in Inorganic Metal-Organic and Nano-Metal Chemistry, 39 (6). pp. 331-340. ISSN 1553-3174

Naga Siva Kumar, G. ; Mitra, Sushanta K. ; Ramgopal Rao, V. (2009) Fabrication of dielectrophoretic microfluidic device ASME Conference Proceedings . pp. 113-119.

Chawda, Pradeep Kumar ; Anand, Bulusu ; Ramgopal Rao, V. (2009) Optimum body bias constraints for leakage reduction in high-k complementary metal-oxide-semiconductor circuits Japanese Journal of Applied Physics, 48 . 054501_1-054501_3. ISSN 0021-4922

Kobayashi, Yusuke ; Sachid, Angada B. ; Tsutsui, Kazuo ; Kakushima, Kuniyuki ; Ahmet, Parhat ; Ramgopal Rao, V. ; Iwai, H. (2008) Analysis of threshold voltage variations of FinFETs relating to short channel effects Electro-Chemical-Society (ECS) Transactions, 16 (40). pp. 23-27. ISSN 1938-5862

Tiwari, S. P. ; Srinivas, P. ; Shriram, S. ; Kale, Nitin S. ; Mhaisalkar, S. G. ; Ramgopal Rao, V. (2008) Organic FETs with HWCVD silicon nitride as a passivation layer and gate dielectric Thin Solid Films, 516 (5). pp. 770-772. ISSN 0040-6090

Dudhe, Ravishankar S. ; Tiwari, S. P. ; Raval, Harshil N. ; Khaderbad, Mrunal A. ; Singh, Rahul ; Sinha, Jasmine ; Yedukondalu, M. ; Ravikanth, M. ; Kumar, Anil ; Ramgopal Rao, V. (2008) Explosive vapor sensor using poly (3-hexylthiophene) and Cu^II tetraphenylporphyrin composite based organic field effect transistors Applied Physics Letters, 93 (26). 263306_1-263306_3. ISSN 0003-6951

Maji, Debabrata ; Crupi, Felice ; Giusi, Gino ; Pace, Calogero ; Simoen, Eddy ; Claeys, Cor ; Ramgopal Rao, V. (2008) On the dc and noise properties of the gate current in epitaxial Ge p-channel metal oxide semiconductor field effect transistors with TiN/TaN/HfO₂/SiO₂ gate stack Applied Physics Letters, 92 (16). 163508_1-163508_3. ISSN 0003-6951

Hariharan, V. ; Vasi, Juzer ; Ramgopal Rao, V. (2007) Drain current model for undoped symmetric double-gate FETs using a velocity saturation model with exponent n=2 Proceedings of the 2007 International Semiconductor Device Research Symposium (ISDRS), Universit of Maryland, College Park, USA . pp. 1-2.

Rajwade, S. R. ; Kulkarni, P. D. ; Mukherji, S. ; Rao, K. K. ; Ramgopal Rao, V. (2007) Polymerization on DNA templates for nanoelectronics applications Journal of Scanning Probe Microscopy, 2 (1-2). pp. 32-35. ISSN 1557-7937

Kobayashi, Yusuke ; Raghunathan Manoj, C. ; Tsutsui, Kazuo ; Hariharan, Venkanarayan ; Kakushima, Kuniyuki ; Ramgopal Rao, V. ; Ahmet, Parhat ; Iwai, Hiroshi (2007) Parasitic effects in multi-gate MOSFETs IEICE - Transactions on Communications, E90-C (10). pp. 2051-2056. ISSN 0916-8516

Tiwari, S. p. ; Namdas, E. B. ; Ramgopal Rao, V. ; Fichou, D. ; Mhaisalkar, S. G. (2007) Solution-processed n-type organic field-effect transistors with high ON/OFF current ratios based on fullerene derivatives IEEE Electron Device Letters, 28 (10). pp. 880-883. ISSN 0741-3106

Nayak, K. ; Kulkarni, P. D. ; Deepu, A. ; Sitaraman, V. R. ; Punidha, S. ; Saha, A. A. ; Ravikanth, M. ; Mitra, S. K. ; Mukherji, S. ; Ramgopal Rao, V. (2007) Patterned microfluidic channels using self-assembled hydroxy-phenyl porphyrin monolayer Proceedings of the 7th IEEE International Conference on Nanotechnology, Hong Kong . pp. 1235-1239.

Manoj, C. R. ; Nagpal, M. ; Ramgopal Rao, V. (2007) Improving the DC performance of Bulk FinFETs by optimum body doping Proceedings of the 14th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), Bangalore, India . pp. 180-184.

Joshi, Manoj ; Kale, Nitin ; Lal, Rakesh ; Ramgopal Rao, V. ; Mukherji, Soumyo (2007) A novel dry method for surface modification of SU-8 for immobilization of biomolecules in Bio-MEMS Biosensors and Bioelectronics, 22 (11). pp. 2429-2435. ISSN 0956-5663

Kobayashi, Yusuke ; Tsutsui, Kazuo ; Kakushima, Kuniyuki ; Hariharan, Venkanarayan ; Ramgopal Rao, V. ; Ahmet, Parhat ; Iwai, Hiroshi (2007) Parasitic effects depending on shape of spacer region on FinFETs Electro-Chemical-Society (ECS) Transactions, 6 (4). pp. 83-87. ISSN 1938-5862

Joshi, Manoj ; Kale, Nitin ; Mukherji, S. ; Lal, R. ; Ramgopal Rao, V. (2007) Affinity cantilever sensors for cardiac diagnostics Indian Journal of Pure & Applied Physics, 45 . pp. 287-293. ISSN 0019-5596

Chakraborty, Saurav ; Mallik, Abhijit ; Sarkar, Chandan Kumar ; Ramgopal Rao, V. (2007) Impact of halo doping on the subthreshold performance of deep-submicrometer CMOS devices and circuits for ultralow power analog/mixed-signal applications IEEE Transactions on Electron Devices, 54 (2). pp. 241-248. ISSN 0018-9383

Joshi, Manoj ; Pinto, Richard ; Ramgopal Rao, V. ; Mukherji, Soumyo (2007) Silanization and antibody immobilization on SU-8 Applied Surface Science, 253 (6). pp. 3127-3132. ISSN 0169-4332

Sarkar, Partha ; Mallik, Abhijit ; Sarkar, Chandan Kumar ; Ramgopal Rao, V. (2006) The effects of varying tilt angle of halo implant on the performance of sub 100nm LAC MOSFETs International Conference on Industrial and Information Systems, Srilanka . pp. 115-118.

Narasimhulu, K. ; Ramgopal Rao, V. (2006) xAnalog device and circuit performance degradation under substrate bias enhanced hot carrier stress 44th Annual International Reliability Physics Symposium (IRPS), San Jose, California, USA . pp. 465-470.

Narasimhulu, K. ; Ramgopal Rao, V. (2006) Analog circuit performance issues with aggressively scaled gate oxide CMOS technologies Proceedings - IEEE International Conference on VLSI Design . p. 6. ISSN 1063-9667

Sathyapalan, Amarchand ; Lohani, Anup ; Santra, Sangita ; Goyal, Saurabh ; Ravikanth, M. ; Mukherji, Soumyo ; Ramgopal Rao, V. (2005) Preparation, characterization and electrical properties of a novel self-assembled meso-pyridyl porphyrin monolayer on gold surfaces Australian Journal of Chemistry, 58 (11). pp. 810-816. ISSN 0004-9425

Sathyapalan, Amarchand ; Lohani, Anup ; Santra, Sangita ; Goyal, Saurabh ; Ravikanth, M. ; Mukherji, Soumyo ; Ramgopal Rao, V. (2005) Preparation, characterization, and electrical properties of a self-assembled meso-pyridyl porphyrin monolayer on gold surfaces Australian Journal of Chemistry, 58 (11). pp. 810-816. ISSN 0004-9425

Hakim, Najeeb-ud-din ; Ramgopal Rao, V. ; Vasi, J. (2005) Design of a 0.1 µm single halo (SH) thin film silicon-on-insulator (SOI) MOSFET for analogue applications Semiconductor Science and Technology, 20 (9). pp. 895-902. ISSN 0268-1242

Sathyapalan, A. ; Lohani, A. ; Santra, S. ; Ravikanth, M. ; Mukherji, S. ; Ramgopal Rao, V. (2005) A meso-pyridyl porphyrin self-assembled monolayer on gold substrates for molecular electronics applications Proceedings of the 5th IEEE Conference on Nanotechnology, Nagoya, Japan, 1 . pp. 238-240.

Narasimhulu, K. ; Ramgopal Rao, V. (2005) Deep sub-micron device and analog circuit parameter sensitivity to process variations with halo doping and its effect on circult linearity Japanese Journal of Applied Physics, 44 . pp. 2180-2186. ISSN 0021-4922

Chawda, Pradeep Kumar ; Anand, Balusu ; Ramgopal Rao, V. (2004) Effectiveness of optimum body bias for leakage reduction in high-K CMOS circuits Proceedings of the 35th International Conference on Solid State Devices and Materials (SSDM 2004), Tokyo, Japan . pp. 434-435.

Ramgopal Rao, V. ; Mohapatra, Nihar R. (2004) Device and circuit performance issues with deeply scaled high-K MOS transistors Journal of Semiconductor Technology and Science, 4 (1). pp. 52-62. ISSN 1598-1657

Mohapatra, N. R. ; Nair, D. R. ; Mahapatra, S. ; Ramgopal Rao, V. ; Shukuri, S. ; Bude, J. D. (2003) CHISEL programming operation of scaled NOR flash EEPROMs-effect of voltage scaling, device scaling, and technological parameters IEEE Transactions on Electron Devices, 50 (10). pp. 2104-2111. ISSN 0018-9383

ManjulaRani, K. N. ; Ramgopal Rao, V. ; Vasi, J. (2003) Reliability of ultrathin JVD silicon nitride MNSFETs under high field stressing IEEE Transactions on Device and Materials Reliability . pp. 168-172.

Patil, Samadhan B. ; Vairagar, Anand V. ; Kumbhar, Alka A. ; Sahu, Laxmi K. ; Ramgopal Rao, V. ; Venkatramani, N. ; Dusane, R. O. ; Schroeder, B. (2003) Highly conducting doped poly-Si deposited by hot wire CVD and its applicability as gate material for CMOS devices Thin Solid Films, 430 (1-2). pp. 63-66. ISSN 0040-6090

Mohapatra, N. R. ; Desai, M. P. ; Narendra, S. G. ; Ramgopal Rao, V. (2003) Modeling of parasitic capacitances in deep submicrometer conventional and high-K dielectric MOS transistors IEEE Transactions on Electron Devices, 50 (4). pp. 959-966. ISSN 0018-9383

Waghmare, Parag C. ; Patil, Samadhan B. ; Kumbhar, Alka ; Dusane, R. O. ; Ramgopal Rao, V. (2002) Ultra-thin silicon nitride by hot wire chemical vapor deposition (HWCVD) for deep sub-micron CMOS technologies Microelectronic Engineering, 61-62 . pp. 625-629. ISSN 0167-9317

Borse, D. G. ; M. Rani, K. N. ; Jha, N. K. ; Chandorkar, A. N. ; Vasi, J. ; Ramgopal Rao, V. ; Cheng, B. ; Woo, J. C. S. (2002) Optimization and realization of sub-100-nm channel length single halo p-MOSFETs IEEE Transactions on Electron Devices, 49 (6). pp. 1077-1079. ISSN 0018-9383

Najeev-ud-din, ; Dunga, M. V. ; Kumar, A. ; Vasi, J. ; Ramgopal Rao, V. ; Cheng, Baohong ; Woo, J. C. S. (2002) Änalysis of floating body effects in thin film conventional and single pocket SOI MOSFETs using the GIDL current technique IEEE Electron Device Letters, 23 (4). pp. 209-211. ISSN 0741-3106

Dixit, A. ; Pal, D. K. ; Roy, J. N. ; Ramgopal Rao, V. (2002) Channel engineering for sub-micron CMOS technologies Proceedings of the 11th International Workshop on The Physics of Semiconductor Devices, Delhi, India, 4746 (2). pp. 637-640.

Najeeb-ud-Din, ; Ramgopal Rao, V. ; Vasi, J. (2002) Characterization and simulation of lateral asymmetric Channel silicon-on-insulator MOSFETs Proceedings of the 11th International Workshop on The Physics of Semiconductor Devices, Delhi, India, 4746 (2). pp. 644-648. ISSN 1017-2653

ManjulaRani, K. N. ; Ramgopal Rao, V. ; Vasi, J. (2002) Degradation study of ultra-thin JVD silicon nitride MNSFETs MRS Proceedings, 716 . B4.18_1-B4.18_6. ISSN 1946-4274

Mohapatra, Nihar Ranjan ; Mahapatra, Souvik ; Ramgopal Rao, V. (2002) Device scaling effects on substrate enhanced degradation in MOS transistors MRS Proceedings, 716 . B7.2_1-B7.2_6. ISSN 1946-4274

Bhuwalka, Krishna Kumar ; Mohapatra, Nihar R. ; Narendra, Siva G. ; Ramgopal Rao, V. (2002) Effective dielectric thickness scaling for high-K gate dielectric MOSFETs MRS Proceedings, 716 . B4.19 _1-B4.19 _5. ISSN 1946-4274

Dixit, Abhisek ; Dusane, Rajiv O. ; Ramgopal Rao, V. (2002) Electrically induced junction MOSFET for high performance sub-50nm CMOS technology MRS Proceedings, 716 . B7.6_1-B7.6_6. ISSN 1946-4274

ManjulaRani, K. N. ; Ramgopal Rao, V. ; Vasi, J. (2002) High field stressing effects in JVD Nitride capacitors Proceedings of the 11th International Workshop on the Physics of Semiconductor Devices, 4746 (2). pp. 1316-1319. ISSN 1017-2653

Waghmare, Parag C. ; Patil, Samadhan B. ; Dusane, Rajiv O. ; Ramgopal Rao, V. (2002) Improvement in gate dielectric quality of ultra thin a: SiN:H MNS capacitor by hydrogen etching of the substratet MRS Proceedings, 716 . B4.8_1-B4.13_6. ISSN 1946-4274

Porwal, Abhay ; Narsude, Mayur ; Ramgopal Rao, V. ; Mukherji, Soumyo (2002) Microcantilever based biosensors IETE Technical Review, 19 (5). pp. 257-267. ISSN 0256-4602

Jha, Neeraj K. ; Ramgopal Rao, V. ; Woo, J. C. S. (2002) Optimization of single halo p-MOSFET implant parameters for improved analog performance and reliability Proceedings of the 32nd European Solid-State Device Research Conference (ESSDERC), Florence, Italy . pp. 603-606.

Mutha, Y. M. ; Lal, R. ; Ramgopal Rao, V. (2002) Physical mechanisms for pulsed AC stress degradation in thin gate oxide MOSFETs Proceedings of the 9th IEEE International Symposium on Physical and Failure Analysis of Integrated Circuits, Singapore . pp. 250-253.

Mutha, Yatin ; ManjulaRani, K. N. ; Lal, Rakesh ; Ramgopal Rao, V. (2002) Polarity dependence of degradation in ultra thin oxide and JVD nitride gate dielectrics MRS Proceedings, 716 . B7-22_1-B7-22_6. ISSN 1946-4274

Poornima, P. ; Tripathy, S. K. ; Ramgopal Rao, V. ; Sharma, D. K. (2002) Resolution enhancement techniques for optical lithography Proceedings of the 11th International Workshop on The Physics of Semiconductor Devices, Delhi, India, 4746 (2). pp. 1260-1262.

Vairagar, A. V. ; Patil, S. B. ; Pete, D. J. ; Waghmare, P. C. ; Dusane, R. O. ; Venkatraman, N. ; Ramgopal Rao, V. (2002) Suppression of boron penetration by hot wire CVD polysilicon Proceedings of the 9th IEEE International Symposium on Physical and Failure Analysis of Integrated Circuits, Singapore . pp. 223-226.

Najeeb-ud-Din, ; Mohan, Aatish K. ; Dunga, V. ; Ramgopal Rao, V. ; Vasi, J. (2002) Suppression of parasitic BJT action in single pocket thin film deep sub-micron SOI MOSFETs MRS Proceedings, 716 . B1.1_1-B1.1_6. ISSN 1946-4274

Kumar, Aatish ; Lal, Rakesh ; Ramgopal Rao, V. (2001) A simple and direct technique for interface characterization of SOI MOSFETs and its application in hot carrier degradation studies in sub-100 nm JVD MNSFETs Microelectronic Engineering, 59 (1-4). pp. 429-433. ISSN 0167-9317

Mohapatra, N. R. ; Mahapatra, S. ; Ramgopal Rao, V. (2001) Study of degradation in channel in initiated secondary electron injection regime Proceedings of the 31st European Solid-State Device Research Conference (ESSDERC), Nuremberg, Germany . pp. 291-294.

Mohapatra, N. R. ; Desai, M. P. ; Narendra, S. G. ; Ramgopal Rao, V. (2001) The impact of high-K gate dielectrics on sub 100 nm CMOS circuit performance Proceedings of the 31st European Solid-State Device Research Conference (ESSDERC), Nuremberg, Germany . pp. 239-242.

Patil, Samadhan B. ; Kumbhar, Alka ; Waghmare, Parag ; Ramgopal Rao, V. ; Dusane, R. O. (2001) Low temperature silicon nitride deposited by Cat-CVD for deep sub-micron metal-oxide-semiconductor devices Thin Solid Films, 395 (1-2). pp. 270-274. ISSN 0040-6090

Dunga, M. V. ; Kumar, A. ; Ramgopal Rao, V. (2001) Analysis of floating body effects in thin film SOI MOSFETs using the GIDL current technique Proceedings of 8th IEEE International Symposium on Physical and Failure Analysis of Integrated Circuits, Singapore . pp. 254-257.

Najeeb-ud-Din, ; Dunga, M. V. ; Kumar, A. ; Ramgopal Rao, V. ; Vasi, J. (2001) Characterization of lateral asymmetric channel (LAC) thin film SOI MOSFETs 6th International Conference on Solid-State and Integrated Circuit Technology (ICSICT), Shanghai, China, 1 . pp. 655-660.

Mohapatra, N. R. ; Dutta, A. ; Desai, M. P. ; Ramgopal Rao, V. (2001) Effect of fringing capacitances in sub 100 nm MOSFETs with high-K gate dielectrics Proceedings of the 14th International Conference on VLSI Design, Bangalore, India . pp. 479-482.

Shrivastav, G. ; Mahapatra, S. ; Ramgopal Rao, V. ; Vasi, J. (2001) Performance optimization of 60 nm channel length vertical MOSFETs using channel engineering Proceedings of the 14th International Conference on VLSI Design, Bangalore, India . pp. 475-478.

Anil, K. G. ; Mahapatra, S. ; Ramgopal Rao, V. ; Eisele, I. (2000) Comparison of sub-bandgap impact ionization in deep-sub-micron conventional and lateral asymmetrical channel nMOSFETs Proceedings of the International Conference on Solid state Devices and Materials (SSDM) Sendai, Japan . pp. 60-61.

Suryagandh, Sushant S. ; Ramgopal Rao, V. (2000) Dynamic Threshold voltage MOSFETs for future low power sub 1V CMOS applications SPIE Proceedings Series, 3975 (2). pp. 655-658. ISSN 1017-2653

Patil, Samadhan B. ; Vaidya, Sangeeta ; Kumbhar, Alka ; Dusane, R. O. ; Chandorkar, A. N. ; Ramgopal Rao, V. (2000) Low temperature Hot-Wire CVD nitrides for deep sub-micron CMOS technologies SPIE Proceedings Series, 3975 (2). pp. 879-882. ISSN 1017-2653

Mahapatra, S. ; Ramgopal Rao, V. ; Vasi, J. ; Cheng, B. ; Woo, J. C. S. (2000) Reliability studies on sub 100 nm SOI-MNSFETs Proceedings of the International Integrated Reliability Workshop, California, USA . pp. 29-31.

Mahapatra, S. ; Manjularani, K. N. ; Ramgopal Rao, V. ; Vasi, J. (2000) ULSI MOS transistors with jet vapour deposited (JVD) silicon nitride for the gate insulator SPIE Proceedings Series, 3975 (2). pp. 803-810. ISSN 1017-2653

Mahapatra, S. ; Ramgopal Rao, V. ; Parikh, C. D. ; Vasi, J. ; Cheng, B. ; Khare, M. ; Woo, J. C. S. (1999) Hot-carrier induced interface degradation in jet vapor deposited SiN MNSFETs as studied by a novel charge pumping technique 29th European Solid-State Device Research Conference (ESSDERC), Leuven, Belgium . pp. 592-595.

Ramgopal Rao, V. ; Hansch, W. ; Mahapatra, S. ; Sharma, D. K. ; Vasi, J. ; Grabolla, T. ; Eisele, I. (1999) Low temperature-high pressure grown thin gate dielectrics for MOS applications Microelectronic Engineering, 48 (1-4). pp. 223-226. ISSN 0167-9317

Mahapatra, S. ; Ramgopal Rao, V. ; Parikh, C. D. ; Vasi, J. ; Cheng, B. ; Woo, J. C. S. (1999) A study of 100 nm channel length asymmetric channel MOSFET by using charge pumping Microelectronic Engineering, 48 (1-4). pp. 193-196. ISSN 0167-9317

Mahapatra, S. ; Parikh, C. D. ; Vasi, J. ; Ramgopal Rao, V. ; Viswanathan, C. R. (1999) A direct charge pumping technique for spatial profiling of hot-carrier induced interface and oxide traps in MOSFETs Solid-State Electronics, 43 (5). pp. 915-922. ISSN 0038-1101

Mahapatra, S. ; Ramgopal Rao, V. ; Manjula Rani, K. N. ; Parikh, C. D. ; Vasi, J. ; Cheng, B. ; Khare, M. ; Woo, J. C. S. (1999) 100 nm channel length MNSFETs using a jet vapor deposited ultra-thin silicon nitride gate dielectric Technical Digest, 1999 Symposium on VLSI Technology, Kyoto, Japan . pp. 79-80.

Viswanathan, C. R. ; Ramgopal Rao, V. (1998) Application of charge pumping technique for sub-micron MOSFET characterization Microelectronic Engineering, 40 (3-4). pp. 131-146. ISSN 0167-9317

Cheng, B. ; Ramgopal Rao, V. ; Ikegami, B. ; Woo, J. C. S. (1998) Realization of 0.1 um asymmetric channel MOSFETs with excellent short-channel performance and reliability Technical Digest, 28th European Solid-State Device Research Conference (ESSDERC), Bordeaux, France . pp. 520-523.

Sachdev, R. ; Wijeratne, G. ; Ramgopal Rao, V. ; Viswanathan, C. R. (1998) A study of the effect of plasma etch damage on sub-micron MOSFET's flicker noise properties Technical Digest, 28th European Solid-State Device Research Conference (ESSDERC), Bordeaux, France . pp. 572-575.

Inani, A. ; Ramgopal Rao, V. ; Cheng, B. ; Cao, M. ; Voorde, P. V. ; Greene, W. ; Woo, J. C. S. (1998) Performance considerations in using high-k dielectrics for deep sub-micron MOSFETs Proceedings of the Solid state Devices and Materials (SSDM) Research Conference, Hiroshima, Japan . pp. 94-95.

Ramgopal Rao, V. ; Wijeratne, G. ; Chu, D. ; Brozek, T. ; Viswanathan, C. R. (1998) Plasma process induced abnormal 1/f noise behavior in deep sub-micron MOSFETs 3rd International Symposium on Plasma Process-Induced Damage (P2ID), Hawaii, USA . pp. 124-127.

Hansch, W. ; Ramgopal Rao, V. ; Fink, C. ; Kaesen, F. ; Eisele, I. (1998) Electric field tailoring in MBE-grown vertical sub-100 nm MOSFETs Thin Solid Films, 321 (1-2). pp. 206-214. ISSN 0040-6090

Viswanathan, C. R. ; Ramgopal Rao, V. ; Brozek, T. (1998) Localized charge injection: a tool to investigate plasma damage in CMOS devices SPIE Proceedings Series, 3316 (2). pp. 980-985. ISSN 1017-2653

Ramgopal Rao, V. ; Hansch, W. ; Eisele, I. (1997) Simulation, fabrication and characterization of high performance planar-doped-barrier sub 100 nm channel MOSFETs Technical Digest - International Electron Devices Meeting . pp. 811-814. ISSN 0163-1918

Ramgopal Rao, V. ; Hansch, W. ; Baumgartner, H. ; Eisele, I. ; Sharma, D. K. ; Vasi, J. ; Grabolla, T. (1997) Charge trapping behaviour in deposited and grown thin metal-oxide-semiconductor gate dielectrics Thin Solid Films, 296 (1-2). pp. 37-40. ISSN 0040-6090

Ramgopal Rao, V. ; Eisele, I. ; Patrikar, R. M. ; Sharma, D. K. ; Vasi, J. ; Grabolla, T. (1997) High-field stressing of LPCVD gate oxides IEEE Electron Device Letters, 18 (3). pp. 84-86. ISSN 0741-3106

Ramgopal Rao, V. ; Sharma, D. K. ; Vasi, J. (1996) Neutral electron trap generation under irradiation in reoxidized nitrided gate dielectrics IEEE Transactions on Electron Devices, 43 (9). pp. 1467-1470. ISSN 0018-9383

Ramgopal Rao, V. ; Vasi, J. (1992) Radiation-induced interface-state generation in reoxidized nitrided SiO₂ Journal of Applied Physics, 71 (2). 1029_1-1029_3. ISSN 0021-8979