Items where Author is "Nouri, F."

Islam, A. E. ; Gupta, G. ; Mahapatra, S. ; Krishnan, A. T. ; Ahmed, K. ; Nouri, F. ; Oates, A. ; Alam, M. A. (2006) Gate leakage vs. NBTI in plasma nitrided oxides: characterization, physical principles and optimization In: 2006 International Electron Devices Meeting, IEDM '06, 11-13 Dec, 2006, San Francisco, CA, USA.

Varghese, D. ; Saha, D. ; Mahapatra, S. ; Ahmed, K. ; Nouri, F. ; Alam, M. (2005) On the dispersive versus arrhenius temperature activation of nbti time evolution in plasma nitrided gate oxides: measurements, theory and implications In: 2005 IEEE International Electron Devices Meeting, IEDM Technical Digest, 5-5 Dec, 2005, Washington, DC, USA.