Items where Author is "Eichfeld, C."
Group by: Item Type | No Grouping Jump to: Conference or Workshop Item Number of items: 1. Conference or Workshop ItemPandey, R. ; Agrawal, N. ; Chobpattana, V. ; Henry, K. ; Kuhn, M. ; Liu, H. ; Labella, M. ; Eichfeld, C. ; Wang, K. ; Maier, J. ; Stemmer, S. ; Mahapatra, S. ; Datta, S. (2015) Tunnel junction abruptness, source random dopant fluctuation and PBTI induced variability analysis of GaAs0.4Sb0.6/In0.65Ga0.35As heterojunction tunnel FETs In: 2015 IEEE International Conference on Electron Devices Meeting (IEDM), 7-9 Dec. 2015, Washington, DC, USA. |
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