Items where Author is "Basu, Saibal"

Vedpathak, Mahesh ; Basu, Saibal ; Gokhale, Shubha ; Kulkarni, S. K. (1998) Studies with Ni/Ti multilayer films using X-ray photoelectron spectroscopy and neutron reflectometry: microscopic characterization of structure and chemical composition Thin Solid Films, 335 (1-2). pp. 13-18. ISSN 0040-6090

Vedpathak, Mahesh ; Basu, Saibal ; Kulkarni, S. K. (1997) Characterization of nickel-copper multilayer and copper thin film using neutron reflectivity measurements Applied Surface Science, 115 (4). pp. 311-316. ISSN 0169-4332