Optical microscopic, X-ray diffraction, and electrical resistance studies of CuCl at high pressure

Piermarini, G. J. ; Mauer, F. A. ; Block, S. ; Jayaraman, A. ; Geballe, T. H. ; Hull, G. W. (1979) Optical microscopic, X-ray diffraction, and electrical resistance studies of CuCl at high pressure Solid State Communications, 32 (4). pp. 275-279. ISSN 0038-1098

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Official URL: http://www.sciencedirect.com/science/article/pii/0...

Related URL: http://dx.doi.org/10.1016/0038-1098(79)90946-3

Abstract

Electrical resistance and X-ray diffraction measurements and also optical observations under a polarizing microscope were made on CuCl to pressures in excess of 12.5 GPa at room temperature using a diamond anvil cell. Resistance measurements were also performed in a piston-cylinder apparatus to pressures of approximately 5.5 GPa at room temperature. Three samples of CuCl prepared by different methods were examined. No anomalous pressure dependence in electrical resistance was found in the pressure range studied, and no dramatic changes in optical transmission were observed up to pressures of approximately 10.0 GPa. Optical observations and X-ray diffraction measurements indicate the existence of four phases in the pressure range studied, including a nonconducting black opaque phase which grows with time when CuCl is left for several days at the highest pressures.

Item Type:Article
Source:Copyright of this article belongs to Elsevier Science.
ID Code:96016
Deposited On:30 Nov 2012 06:54
Last Modified:30 Nov 2012 06:54

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