Babu Rao, C. ; Ananthalakshmi, A. V. ; Kesavamoorthy, R. ; Baldev Raj, (1998) Inspection of the surface of thin wires using laser scattering at oblique illumination Insight, 40 (8). pp. 567-570. ISSN 1354-2575
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Abstract
Conventional methods of estimating surface roughness have limited use in the case of thin wires. This paper discusses the use of laser scattering with oblique illumination to identify the region of roughness along the axis of the wire. A method to localise the sector of roughness along the circumference of thin wire is also described.
| Item Type: | Article |
|---|---|
| Source: | Copyright of this article belongs to British Institute of Non-Destructive Testing. |
| ID Code: | 90602 |
| Deposited On: | 11 May 2012 07:28 |
| Last Modified: | 11 May 2012 07:28 |
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