Influence of incident beam divergence on the intensity of diffuse streaks

Pandey, Dhananjai ; Lele, S. ; Prasad, Lalita ; Gauthier, J. P. (1985) Influence of incident beam divergence on the intensity of diffuse streaks Bulletin of Materials Science, 7 (5). pp. 499-507. ISSN 0250-4707

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Official URL: http://www.ias.ac.in/j_archive/bms/7/2/499-508/vie...

Related URL: http://dx.doi.org/10.1007/BF02744060

Abstract

The influence of incident beam divergence on the length of the streak intercepted by the Ewald sphere is considered, as a relp HK-L of a faulted hexagonal crystal, mounted about itsc-axis on the goniometer head attached to the ∅-circle, is brought into diffracting condition for the bisecting setting of a 4-circle diffractometer. For the special crystal mounting correction factors required to convert the measured intensities corresponding to a fixed length of the streak are derived. A procedure for experimentally verifying the mathematical approach employed in these derivations is also presented.

Item Type:Article
Source:Copyright of this article belongs to Indian Academy of Sciences.
Keywords:Incident Beam Divergence; Diffuse Streaks; Ewald Sphere; Crystal Orientation
ID Code:88770
Deposited On:29 Mar 2012 14:35
Last Modified:19 May 2016 03:32

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