Surface and interface study of pulsed-laser-deposited off-stoichiometric NiMnSb thin films on a Si(100) substrate

Rai, S. ; Tiwari, M. K. ; Lodha, G. S. ; Modi, M. H. ; Chattopadhyay, M. K. ; Majumdar, S. ; Gardelis, S. ; Viskadourakis, Z. ; Giapintzakis, J. ; Nandedkar, R. V. ; Roy, S. B. ; Chaddah, P. (2006) Surface and interface study of pulsed-laser-deposited off-stoichiometric NiMnSb thin films on a Si(100) substrate Physical Review B: Condensed Matter and Materials Physics, 73 (3). 035417_1-035417_5. ISSN 1098-0121

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Official URL: http://prb.aps.org/abstract/PRB/v73/i3/e035417

Related URL: http://dx.doi.org/10.1103/PhysRevB.73.035417

Abstract

We report a detailed study of surface and interface properties of pulsed-laser-deposited NiMnSb films on a Si(100) substrate as a function of film thickness. As the thickness of films is reduced below 35 nm, formation of a porous layer is observed. Porosity in this layer increases with decrease in NiMnSb film thickness. These morphological changes of the ultrathin films are reflected in the interesting transport and magnetic properties of these films. Compositional anomaly and surface and interface roughness are not the source of magnetic and transport properties of the films.

Item Type:Article
Source:Copyright of this article belongs to The American Physical Society.
ID Code:84472
Deposited On:25 Feb 2012 13:57
Last Modified:19 May 2016 00:54

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