Chokshi, Atul H. (2008) Microstructural stability and creep in nanocrystals Materials Science Forum, 584-586 . pp. 876-883. ISSN 0255-5476
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Official URL: http://www.scientific.net/MSF.584-586.876
Related URL: http://dx.doi.org/10.4028/www.scientific.net/MSF.584-586.876
Abstract
Microstructural stability is an important consideration during high temperature deformation and processing of nanomaterials. We will address issues relating to triple junctions in limiting grain growth during creep as well as densification. Although early studies on deformation have considered diffusion creep as a possible rate controlling deformation mechanism in nanocrystals, a critical inspection of available data indicates that there is no strong evidence for conventional diffusion creep in such materials. The possibility of diffusion creep by rapid diffusion along triple junctions will be analyzed, and interface controlled diffusion creep will also be discussed critically. It is shown that the critical grain size for dislocation activity is similar to that for occurrence of conventional diffusion creep.
Item Type: | Article |
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Source: | Copyright of this article belongs to Trans Tech Publications Inc. |
Keywords: | Nanocrystal; Grain Growth; Creep; Dislocations; Diffusion |
ID Code: | 84169 |
Deposited On: | 24 Feb 2012 11:29 |
Last Modified: | 24 Feb 2012 11:29 |
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