Resonant soft X-ray reflectivity as a sensitive probe to investigate polished zinc sulphide surface

Gupta, Pooja ; Sinha, A. K. ; Modi, M. H. ; Gupta, S. M. ; Gupta, P. K. ; Deb, S. K. (2010) Resonant soft X-ray reflectivity as a sensitive probe to investigate polished zinc sulphide surface Applied Surface Science, 257 (1). pp. 210-214. ISSN 0169-4332

Full text not available from this repository.

Official URL: http://www.sciencedirect.com/science/article/pii/S...

Related URL: http://dx.doi.org/10.1016/j.apsusc.2010.06.066

Abstract

Resonant soft X-ray reflectivity measurements at and near the L3 absorption edge of sulphur have been performed on mechanically polished zinc sulphide using Indus-1 synchrotron source. A sulphur rich surface (~15 nm thick) consisting of two layers with gradient electron density distribution was uniquely determined. As compared to bulk ZnS, the top layer has ~30-50% less electron density whereas, the intermediate layer has ~10-18% less electron density. Conventional hard X-ray reflectivity measurement at Cu Ka wavelength also indicates low electron density (sulphur rich) surface of ZnS but the technique was found insensitive for unique determination of electron density distribution. Optical constants of ZnS in the soft X-ray region (100-250 eV) have been reported for the first time and were in good agreement with the theoretically reported values.

Item Type:Article
Source:Copyright of this article belongs to Elsevier Science.
Keywords:Resonant Reflectivity; Zinc Sulphide; Surface Density; Optical Constants
ID Code:83481
Deposited On:21 Feb 2012 07:55
Last Modified:21 Feb 2012 07:55

Repository Staff Only: item control page