Seralathan, M. ; Rangarajan, S. K. (1985) Scheme of squares: Part II. Systems formalism for sinusoidal perturbations Journal of Electroanalytical Chemistry and Interfacial Electrochemistry, 191 (2). pp. 229-235. ISSN 0022-0728
Full text not available from this repository.
Official URL: http://www.sciencedirect.com/science/article/pii/S...
Related URL: http://dx.doi.org/10.1016/S0022-0728(85)80019-X
Abstract
We extend here the formalism developed in Part I (for the potentiostatic response) to the admittance analysis of the scheme of squares. The results are applicable, as before, to several configurations of the electrode such as the rotating disk or the planar. All that one has to do is "to plug in" the appropriate matrices relating the interfacial concentrations to the fluxes.
Item Type: | Article |
---|---|
Source: | Copyright of this article belongs to Elsevier Science. |
ID Code: | 81239 |
Deposited On: | 04 Feb 2012 12:35 |
Last Modified: | 04 Feb 2012 12:35 |
Repository Staff Only: item control page