Chandrasekhar, S. ; Ramaseshan, S. ; Singh, A. K. (1969) Experimental determination of the extinction factor by the use of polarized X-rays Acta Crystallographica Section A: Foundations of Crystallography, 25 . pp. 140-142. ISSN 0108-7673
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Official URL: http://scripts.iucr.org/cgi-bin/paper?a06435
Related URL: http://dx.doi.org/10.1107/S0567739469000234
Abstract
The problem of estimating the extinction factor by use of polarized X-rays has been re-examined in the light of the theory of X-ray diffraction in real crystals developed recently by Zachariasen. Expressions are given for deriving the extinction-free structure factors in terms of the observed integrated intensities for perpendicular and parallel polarizations. A simple attachment to a diffractometer for analysing the polarization of the diffracted beam is described. Measurements on quartz are presented; the extinction-free structure factors so obtained are in excellent agreement with Zachariasen's calculated values based on new f curves.
Item Type: | Article |
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Source: | Copyright of this article belongs to International Union of Crystallography. |
ID Code: | 7947 |
Deposited On: | 25 Oct 2010 09:38 |
Last Modified: | 30 May 2011 11:31 |
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