Manoj Kumar, G. ; Narayana Rao, D. ; Agarwal, G. S. (2003) Measurement of local field Effects of the host on the lifetimes of embedded emitters Physical Review Letters, 91 (20). 203903_1-203903_4. ISSN 0031-9007
|
PDF
- Publisher Version
101kB |
Official URL: http://prl.aps.org/abstract/PRL/v91/i20/e203903
Related URL: http://dx.doi.org/10.1103/PhysRevLett.91.203903
Abstract
We report experimental results on the variation of the radiative lifetime of Eu3+ ion embedded in a dielectric with the refractive index n. We dope 1 mol % of Eu3+ into the binary glass system xPbO-(1-x)B2O3. By varying x we have achieved a fairly large variation of the refractive index from 1.7 to 2.2. This enables us to study the local field effects for the first time for ions doped in a solid glassy material. Our measurements are in agreement with the so-called real cavity model. The present measurements are free from the complications arising from reorganizational effects in solvents.
Item Type: | Article |
---|---|
Source: | Copyright of this article belongs to The American Physical Society. |
ID Code: | 78350 |
Deposited On: | 19 Jan 2012 12:21 |
Last Modified: | 18 May 2016 21:11 |
Repository Staff Only: item control page