Mathur, D. ; Rajgara, F. A. ; Badrinathan, C. (1990) State-diagnosed charge stripping in low-energy collisions of ground-state and highly excited N+ ions with He Physical Review A, 42 (9). pp. 5282-5285. ISSN 1050-2947
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Official URL: http://pra.aps.org/abstract/PRA/v42/i9/p5282_1
Related URL: http://dx.doi.org/10.1103/PhysRevA.42.5282
Abstract
Translational energy spectra have been measured on N2+ product ions resulting from 2-keV charge-stripping collisions between N+ions and He. The projectile N+ ion beam is produced under varying ion source conditions so as to contain different fractions of a long-lived metastable component. By measuring the endoergic energy defect for charge stripping from ground-state and excited-state projectiles at different electron energies in the ion source, the quantal identity of the N+ metastable state is deduced to be either 2s2p22p' 1D° , which lies 17.9 eV above the 2s22p2 3P ground electronic state, or 2s22p3s 1P°, whose excitation energy is 18.5 eV.
Item Type: | Article |
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Source: | Copyright of this article belongs to The American Physical Society. |
ID Code: | 77543 |
Deposited On: | 13 Jan 2012 06:44 |
Last Modified: | 13 Jan 2012 06:44 |
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