Chopra, K. L. ; Randlett, M. R. ; Bender, S. L. (1968) Measurement of film thickness by electron microprobe analyzer Review of Scientific Instruments, 39 (11). pp. 1755-1756. ISSN 0034-6748
Full text not available from this repository.
Official URL: http://rsi.aip.org/resource/1/rsinak/v39/i11/p1755...
Related URL: http://dx.doi.org/10.1063/1.1683224
Abstract
This article does not have an abstract.
| Item Type: | Article |
|---|---|
| Source: | Copyright of this article belongs to American Institute of Physics. |
| ID Code: | 76401 |
| Deposited On: | 31 Dec 2011 14:40 |
| Last Modified: | 31 Dec 2011 14:40 |
Repository Staff Only: item control page
