Shukla, R. P. ; Perera, G. M. ; George, M. C. ; Venkateswarlu, Putcha (1990) Measurement of birefringence of optical materials using a wedged plate interferometer Optics Communications, 78 (1). pp. 7-12. ISSN 0030-4018
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Official URL: http://www.sciencedirect.com/science/article/pii/0...
Related URL: http://dx.doi.org/10.1016/0030-4018(90)90048-X
Abstract
A nondestructive technique for measuring the birefringence of optical materials such as calcite using wedged plate interferometer is presented. The sample needed for measuring the refractive index must be polished in the form of a parallel plate. The method is based on the measurement of the longitudinal displacement of the focus when the parallel plate is inserted in a converging beam of light. The displacement of the focus is a measure of the refractive index of the optical material. In the case of a uniaxial crystal, the displacement of the focus for the extraordinary ray is different from the displacement of the focus for the ordinary ray. Hence the birefringence of the crystal is determined by measuring the difference between the two focii. It is possible to obtain an accuracy up to 0.0002 in the measurement of birefringence depending on the sample thickness. The method should find its application for the characterization of new crystals in various material research and crystal growth laboratories.
Item Type: | Article |
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Source: | Copyright of this article belongs to Elsevier Science. |
ID Code: | 68575 |
Deposited On: | 08 Nov 2011 03:47 |
Last Modified: | 08 Nov 2011 03:47 |
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