Scaling of the resistance in the two-dimensional Anderson tight-binding model for disordered systems

Abstract

The authors combine the ideas of real-space renormalization and the vector recursion technique for multilead scattering to study the scaling of resistance with size for a disordered square lattice. They obtain an indication of predominant power-law dependence of the logarithm of the averaged resistance with size in the intermediate disordered regime, which smoothly changes to logarithmic behaviour as the disorder goes to zero.