Dhaka, R. S. ; Gururaj, K. ; Abhaya, S. ; Amarendra, G. ; Amirthapandian, S. ; Panigrahi, B. K. ; Nair, K. G. M. ; Lalla, N. P. ; Barman, S. R. (2009) Depth-resolved positron annihilation studies of argon nanobubbles in aluminum Journal of Applied Physics, 105 (5). 054304_1-054304_5. ISSN 0021-8979
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Official URL: http://jap.aip.org/resource/1/japiau/v105/i5/p0543...
Related URL: http://dx.doi.org/10.1063/1.3081653
Abstract
The formation of Ar bubbles in Al has been investigated by using depth-resolved positron annihilation spectroscopy and transmission electron microscopy. Due to Ar bubble formation, the Doppler-broadening S parameter decreases, while the W parameter increases compared to the reference unimplanted Al sample. The effect of Ar ion fluence and annealing temperature on these parameters has been investigated. The presence of Ar at near-surface region has been confirmed by Rutherford backscattering spectroscopy. Transmission electron microscopy also shows that the Ar bubbles are in solid state with fcc structure after annealing at 870 K. The average diameter and lattice parameter of these solid Ar bubbles are estimated to be about 4±1 nm and 0.495±0.005 nm, respectively.
| Item Type: | Article |
|---|---|
| Source: | Copyright of this article belongs to American Institute of Physics. |
| Keywords: | Aluminium; Annealing; Argon; Doppler Broadening; Lattice Constants; Nanostructured Materials; Positron Annihilation; Rutherford Backscattering; Transmission Electron Microscopy |
| ID Code: | 64602 |
| Deposited On: | 12 Oct 2011 05:21 |
| Last Modified: | 12 Oct 2011 05:21 |
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