X-ray diffraction from one-dimensionally disordered 2H crystal undergoing solid state transformation to the 6H structure. I. The layer displacement mechanism

Pandey, Dhananjai ; Lele, Shrikant ; Krishna, P. (1980) X-ray diffraction from one-dimensionally disordered 2H crystal undergoing solid state transformation to the 6H structure. I. The layer displacement mechanism Proceedings of the Royal Society A: Mathematical, Physical & Engineering Sciences, 369 (1739). 435-449 . ISSN 1364-5021

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Official URL: http://rspa.royalsocietypublishing.org/content/369...

Related URL: http://dx.doi.org/10.1098/rspa.1980.0009

Abstract

The 2H or AB... close-packed structure may be transformed to 6H or ABCACB... structure if layer displacement faults occur preferentially on every third close-packed layer. The theory of X-ray diffraction from one-dimensionally disordered crystals undergoing the 2H → 6H structural transformation by such a layer displacement mechanism is developed. It is shown that it is necessary to consider that the faults do not occur entirely at random but prefer to occur at three-layer separations from each other in order to statistically create a 6H structure. The diffraction theory, as developed by earlier workers for 2H crystals containing a completely random distribution of stacking faults, cannot therefore be applied to the present case. An exact expression for the diffracted intensity from crystals undergoing the 2H → 6H transformation has been obtained and the different observable diffraction effects (like change in integrated intensity, peak shift, integral breadth, peak asymmetry) have been predicted.

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