Kumar, Ravi ; Malik, S. K. ; Pinto, R. ; Vijayaraghavan, R. ; Kumar, Dhnanjay (1993) Flux creep in YBa2Cu3O7−y thin films induced by self-field of the transport current Applied Superconductivity, 1 (7-9). pp. 1061-1069. ISSN 0964-1807
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Official URL: http://www.sciencedirect.com/science/article/pii/0...
Related URL: http://dx.doi.org/10.1016/0964-1807(93)90413-V
Abstract
Self-field induced flux creep has been studied in YBa2Cu3O7−y thin films in zero external field at temperatures below Tc. Self-field induced flux creep model, which is the extension of Anderson and Kim conventional flux creep model has been introduced. The verification of the model has been done by performing voltagecurrent measurements on patterned YBa2Cu3O7−y thin films. The variation of pinning potential, u0, as function of temperature is obtained.
| Item Type: | Article |
|---|---|
| Source: | Copyright of this article belongs to Elsevier Science. |
| ID Code: | 61894 |
| Deposited On: | 15 Sep 2011 11:55 |
| Last Modified: | 16 Jul 2012 16:12 |
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