Gopinath, C. S. ; Rajendran, M. ; Varadaraju, U. V. ; Subramanian, S. (1998) Valence charge fluctuations and Tc retention in Tl1-xPbxSr1+xLa1-xCuO5-y(0.0 ≤x ≤0.5) system Journal of Superconductivity, 11 (1). pp. 139-140. ISSN 0896-1107
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Official URL: http://www.springerlink.com/content/m1v23r74016pu1...
Related URL: http://dx.doi.org/10.1023/A:1022639525484
Abstract
Structural and X-ray photoelectron spectroscopy (XPS) studies of the Tl1-xPbxSr1+xLa1-xCuO5-y(0.0 ≤x≤0.5) system have been carried out. The unit cell parameters increase with x. Irrespective of x the Tc is retained in this series and the optimum hole concentration (nh) is maintained for x≤0.5. An increase in Tl 4f and O ls binding energy with x suggests a reduction in their oxidation state. Origin of holes is discussed in terms of charge transfer between Tl, Pb and CuO2 layers.
| Item Type: | Article |
|---|---|
| Source: | Copyright of this article belongs to Springer. |
| Keywords: | XPS; Cuprate Superconductor; Valence Fluctuations; Tc Retention |
| ID Code: | 61790 |
| Deposited On: | 15 Sep 2011 12:07 |
| Last Modified: | 15 Sep 2011 12:07 |
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