Apte, P. R. ; Kumar, D. ; Pinto, R. ; Sharon, M. ; Gupta, L. C. ; Vijayaraghavan, R. (1992) A new contact conductance measurement technique for metal-HTSC film contact IEEE Transactions on Applied Superconductivity, 2 (3). pp. 176-180. ISSN 1051-8223
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Official URL: http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumb...
Related URL: http://dx.doi.org/10.1109/77.160157
Abstract
A four-point contact conductance measurement technique has been developed for measuring the contact conductance of the metal-HTSC film interface. A distributed RG model predicts a small nonzero (residual) resistance from which the contact conductance is determined. The measurement technique is described along with first results.
Item Type: | Article |
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Source: | Copyright of this article belongs to IEEE. |
ID Code: | 61681 |
Deposited On: | 15 Sep 2011 11:54 |
Last Modified: | 10 Jul 2012 08:22 |
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