Bhattacharya, M. ; Mukherjee, M. ; Sanyal, M. K. ; Geue, Th. ; Grenzer, J. ; Pietsch, U. (2003) Energy dispersive X-ray reflectivity technique to study thermal properties of polymer films Journal of Applied Physics, 94 (5). pp. 2882-2887. ISSN 0021-8979
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Official URL: http://jap.aip.org/resource/1/japiau/v94/i5/p2882_...
Related URL: http://dx.doi.org/10.1063/1.1596717
Abstract
A method to study temperature dependent thickness variation of thin films has been developed based on angle and energy dispersive X-ray reflectivity (EDR) techniques. The data analysis scheme developed for this method combines both energy and angle dispersive X-ray reflectivity (ADR) profiles. The ADR technique provides the electron density profile on an absolute scale and the EDR technique facilitates rapid collection of reflectivity data as a function of temperature. We demonstrate the utility of the developed method with results of a study of thermal expansion of single and bilayer polymer films. We could detect a change of the thickness of the film in angstroms and could demonstrate interplay of negative and positive thermal expansions of dissimilar polymer layers in determining density profiles of polymer-polymer interface as a function of temperature.
Item Type: | Article |
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Source: | Copyright of this article belongs to American Institute of Physics. |
Keywords: | Polymer Films; X-ray Reflection; Thermal Expansion; X-ray Chemical Analysis |
ID Code: | 61361 |
Deposited On: | 15 Sep 2011 03:46 |
Last Modified: | 15 Sep 2011 03:46 |
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