Ohkawa, T. ; Yamaguchi, Y. ; Sakata, O. ; Sanyal, M. K. ; Datta, A. ; Banerjee, S. ; Hashizume, H. (1996) Anomalous dispersion X-ray reflectometry for model-independent determination of Al/C multilayer structures Physica B: Condensed Matter, 221 (1-4). pp. 416-419. ISSN 0921-4526
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Official URL: http://www.sciencedirect.com/science/article/pii/0...
Related URL: http://dx.doi.org/10.1016/0921-4526(95)00960-4
Abstract
Electron density profiles across the 90-270 Å depth of Al/C multilayers on Ge substrates are determined from anomalous-dispersion X-ray specular reflectivity data collected at the Ge K edge and away from it. Refractive index parameters for Ge are determined by fits of reflectivity profiles observed from a Ge surface without the Al/C film at the two photon energies and used in the calculation of electron densities for single and triple Al/C bilayers deposited on Ge substrates. The layer structures are clearly resolved and the Al/C interfaces are found to be considerably broader than expected.
| Item Type: | Article |
|---|---|
| Source: | Copyright of this article belongs to Elsevier Science. |
| ID Code: | 61357 |
| Deposited On: | 15 Sep 2011 03:42 |
| Last Modified: | 15 Sep 2011 03:42 |
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