Bhattacharya, M. ; Mukhopadhyay, M. K. ; Pal, S. ; Sanyal, M. K. (2004) Energy dispersive X-ray reflectivity to study phase transitions in thin films Radiation Physics and Chemistry, 70 (4-5). pp. 611-617. ISSN 0969-806X
Full text not available from this repository.
Official URL: http://www.sciencedirect.com/science/article/pii/S...
Related URL: http://dx.doi.org/10.1016/j.radphyschem.2003.12.031
Abstract
We present here characteristics of energy dispersive X-ray reflectivity (EDR) technique that is suitable for studying phase transitions in thin films at both laboratory and synchrotron sources. In spite of the poorer resolution of this technique as compare to more widely used angle dispersive reflectivity technique, rapid data collection capability of the EDR technique will find applications in the studies of nano-structured thin films. We demonstrate merit of this technique here using results of thermal properties of thin organic films.
| Item Type: | Article |
|---|---|
| Source: | Copyright of this article belongs to Elsevier Science. |
| Keywords: | Energy Dispersive X-Ray Reflectivity; Angle Dispersive X-Ray Reflectivity; Polymer Film; Langmuir-Blodgett Film; Melting; Thermal Expansion |
| ID Code: | 61344 |
| Deposited On: | 15 Sep 2011 03:46 |
| Last Modified: | 15 Sep 2011 03:46 |
Repository Staff Only: item control page
