Sanyal, M. K. ; Sinha, S. K. ; Gibaud, A. ; Huang, K. G. ; Carvalho, B. L. ; Rafailovich, M. ; Sokolov, J. ; Zhao, X. ; Zhao, W. (1993) Fourier reconstruction of density profiles of thin films using anomalous X-ray reflectivity Europhysics Letters, 21 (6). pp. 691-696. ISSN 0295-5075
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Official URL: http://iopscience.iop.org/0295-5075/21/6/010?fromS...
Related URL: http://dx.doi.org/10.1209/0295-5075/21/6/010
Abstract
The use of X-ray and neutron reflectivity measurements to determine the density profile across and interface or across thin films has become increasingly popular over the last few years. However, in general convenient model-independent methods of inverting the reflectivity profiles to obtain the density profile have been missing. We present here one such approach using the method of anomalous reflectivity from the substrate and demonstrate its applicability in the case of an organic thin film.
| Item Type: | Article |
|---|---|
| Source: | Copyright of this article belongs to EDP Sciences. |
| ID Code: | 61342 |
| Deposited On: | 15 Sep 2011 03:42 |
| Last Modified: | 15 Sep 2011 03:42 |
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