Estimation of wheat leaf area index from IRS LISS-III data using Price model

Rastogi, A. ; Kalra, N. ; Agarwal, P. K. ; Sharma, S. K. ; Harit, R. C. ; Navalgund, R. R. ; Dadhwal, V. K. (2000) Estimation of wheat leaf area index from IRS LISS-III data using Price model Taylor and Francis Group, 21 (15). pp. 2943-2949. ISSN 0143-1161

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Official URL: http://www.tandfonline.com/doi/abs/10.1080/0143116...

Related URL: http://dx.doi.org/10.1080/01431160050121357

Abstract

A satellite sensor image based model suggested by Price was investigated for the estimation of Leaf Area Index (LAI) using data acquired by Linear Imaging Self Scanner-III (LISS-III) onboard Indian Remote Sensing Satellite-1C (IRS-1C) over two wheat growing sites in India (Karnal and Delhi) for crop seasons 1996-97 and 1997-98, respectively. Besides red and near-infrared (NIR) measurements over vegetation canopy, the model only requires a priori crop specific attentuation constants. These constants were computed for wheat using published and field ground reflectance measurements. Application of the model over 36 fields on which ground estimates of LAI were available, indicated a RMSE of 1.28 and 1.07 for the Karnal and Delhi sites, respectively.

Item Type:Article
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Deposited On:09 Sep 2011 06:51
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