Sen, S. ; Bose, D. N. (1983) Schottky barriers on single-crystal indium telluride Solid State Electronics, 26 (8). pp. 757-759. ISSN 0038-1101
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Official URL: http://linkinghub.elsevier.com/retrieve/pii/003811...
Related URL: http://dx.doi.org/10.1016/0038-1101(83)90038-2
Abstract
Schottky barriers on single-crystal p-In2Te3 were formed with evaporated films of materials Al, Ag and Cu with work-functions ØM<(Eg+xs) while Au, Ni and Pd films with larger Ø M produced ohmic contacts. The barrier heights were found to be 0.72, 0.67 and 0.69 eV respectively, while the ideality factors were 1.15, 3.48 and 6.54. The interface index s was 0.16 compared with the theoretical value of 0.146, its small magnitude indicating the covalent nature of the semiconductor. Barriers on n-In2Te3 showed Ø bn + Øbp = 1.29 eV compared with Eg = 1.12 eV. A surface-state rather than a chemical bonding theory provided a satisfactory explanation of the results.
Item Type: | Article |
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Source: | Copyright of this article belongs to Elsevier Science. |
ID Code: | 5737 |
Deposited On: | 19 Oct 2010 11:14 |
Last Modified: | 23 May 2011 04:21 |
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