Bose, D. N. ; Basu, S. ; Mandal, K. C. ; Mazumdar, D. (1986) Evidence for amphoteric behavior of Ru on CdTe surfaces Applied Physics Letters, 48 (7). pp. 472-474. ISSN 0003-6951
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Official URL: http://apl.aip.org/applab/v48/i7/p472_s1?isAuthori...
Related URL: http://dx.doi.org/10.1063/1.96534
Abstract
Modification of large grain p-CdTe by Ru is shown to reduce the sub-band-gap response and increase minority-carrier diffusion length from 0.67 to 0.92 µm. Contact potential difference (CPD) measurements on n- and p-CdTe show shifts in surface Fermi level in opposite directions corresponding to increase in barrier height in each case. The amphoteric nature of Ru on CdTe surfaces depending on conductivity type is thus inferred. The magnitudes of the changes in CPD are approximately equal to the increase of open circuit voltage V∞ observed in photoelectro-chemical cells.
| Item Type: | Article |
|---|---|
| Source: | Copyright of this article belongs to American Institute of Physics. |
| ID Code: | 5698 |
| Deposited On: | 19 Oct 2010 11:28 |
| Last Modified: | 20 May 2011 10:49 |
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