Singh, Rina Rani ; Goyal, Surendra Prakash ; Khanna, Param Pal ; Mukherjee, Pulok kumar ; Sukumar, Raman (2006) Using morphometric and analytical techniques to characterize elephant ivory Forensic Science International, 162 (1). pp. 144-151. ISSN 0379-0738
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Official URL: http://www.sciencedirect.com/science/article/pii/S...
Related URL: http://dx.doi.org/10.1016/j.forsciint.2006.06.028
Abstract
There is a need to characterize Asian elephant ivory and compare with African ivory for controlling illegal trade and implementation of national and international laws. In this paper, we characterize ivory of Asian and African elephants using Schreger angle measurements, elemental analysis {X-ray fluorescence (XRF), inductively coupled plasma-atomic emission spectroscopy (ICP-AES), and inductively coupled plasma-mass spectroscopy (ICP-MS)} and isotopic analysis. We recorded Schreger angle characteristics of elephant ivory at three different zones in ivory samples of African (n=12) and Asian (n=28) elephants. The Schreger angle ranged from 32° to 145° and 30° to 153° in Asian and African ivory, respectively. Elemental analysis (for Asian and African ivory) by XRF, ICP-AES and ICP-MS provided preliminary data. We attempted to ascertain source of origin of Asian elephant ivory similarly as in African ivory based on isotopes of carbon, nitrogen and strontium. We determined isotopic ratios of carbon (n=31) and nitrogen (n=31) corresponding to diet and rainfall, respectively. Reference ivory samples from five areas within India were analyzed using collagen and powder sample and the latter was found more suitable for forensic analysis. During our preliminary analysis, the range of δ13C values (−13.6±0.15%. and −25.6±0.15%.) and δ15N values (10.2±0.15%. and 3.5±0.15%.) were noted.
Item Type: | Article |
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Source: | Copyright of this article belongs to Elsevier Science. |
Keywords: | Elephant Ivory; Schreger Angle; Morphometry; Inductively Coupled Plasma Analysis-MS; Isotopic Analysis; X-ray Fluorescence |
ID Code: | 51894 |
Deposited On: | 01 Aug 2011 07:46 |
Last Modified: | 01 Aug 2011 07:46 |
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