Bhattacharyya, Somnath ; Subramanyam, S. V. (1997) Metallic conductivity of amorphous carbon films under high pressure Applied Physics Letters, 71 (5). pp. 632-634. ISSN 0003-6951
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Official URL: http://apl.aip.org/resource/1/applab/v71/i5/p632_s...
Related URL: http://dx.doi.org/10.1063/1.120425
Abstract
Amorphous carbon films are prepared by plasma-assisted chemical vapor deposition. Resistivity of the films is measured from 300 down to 8 K showing a negative temperature coefficient of resistivity. An increase of room temperature conductivity from 102 S cm−1 to a value of about 104 S cm−1 is found at a pressure of 2 GPa. At a fixed pressure of 0.5 GPa, the films show a positive temperature coefficient of conductivity in the range from 300 to 200 K, followed by a very weak dependence of temperature down to 15 K. At a pressure of 2 GPa a positive temperature coefficient of resistivity is observed in the range between 300 and 15 K. The metallic behavior of the carbon films under high pressure is explained using electronic structure.
Item Type: | Article |
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Source: | Copyright of this article belongs to American Institute of Physics. |
Keywords: | Metallic Thin Films; Electrical Resistivity; Electrical Conductivity; Plasma CVD Coatings; Thermoelectricity; High-pressure Effects; Electronic Structure; Carbon; Electric Conductivity; Thin Films; Amorphous State; Pressure Dependence;very High Pressure; Temperature Coefficient; Temperature Dependence |
ID Code: | 51456 |
Deposited On: | 28 Jul 2011 11:41 |
Last Modified: | 28 Jul 2011 11:41 |
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