Lai, Ram ; Kulkarni, A. V. ; Dusane, R. O. ; Bhide, V. G. ; Ogale, S. B. (1989) Nature of the disordered state of hydrogenated amorphous silicon as revealed by the study of anelastic relaxation behavior Materials Research Society Symposia Proceedings, 4 (3). pp. 612-615. ISSN 0272-9172
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Related URL: http://dx.doi.org/10.1557/JMR.1989.0612
Abstract
The nature of the disordered state of hydrogenated amorphous silicon is examined for the first time by measurement of anelastic relaxation behavior. It is demonstrated that local structural units and their modifications control the relaxations in these films under different conditions of deposition, aging, and light exposure. Specifically, the light-induced state in this material is shown to be characterized by four distinct relaxations.
Item Type: | Article |
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Source: | Copyright of this article belongs to Materials Research Society. |
ID Code: | 5092 |
Deposited On: | 18 Oct 2010 05:07 |
Last Modified: | 19 May 2011 05:11 |
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