Goyal, D. J. ; Agashe, Chitra ; Takwale, M. G. ; Bhide, V. G. (1993) X-ray diffraction studies of sprayed SnO2:Sb films Journal of Crystal Growth, 130 (3-4). pp. 567-570. ISSN 0022-0248
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Official URL: http://linkinghub.elsevier.com/retrieve/pii/002202...
Related URL: http://dx.doi.org/10.1016/0022-0248(93)90545-8
Abstract
Antimony-doped tin oxide films were deposited by spray pyrolysis on corning 7059 substrates. The structural and electrical properties of the films deposited with different doping levels were studied. Relative variations in the structural properties were explained on the basis of structure factor calculations. The results show that the incorporation of antimony atoms takes place only at substitutional sites. As expected, the substitutional replacement of tin by antimony atoms increased appreciably the free carrier density of the film.
| Item Type: | Article |
|---|---|
| Source: | Copyright of this article belongs to Elsevier Science. |
| ID Code: | 5068 |
| Deposited On: | 18 Oct 2010 05:16 |
| Last Modified: | 19 May 2011 04:52 |
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