Roy, Anushree ; Sood, Ajay K. (1995) Fracton dimension of porous silicon as determined by low-frequency Raman scattering Solid State Communications, 93 (12). pp. 995-998. ISSN 0038-1098
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Official URL: http://www.sciencedirect.com/science/article/pii/0...
Related URL: http://dx.doi.org/10.1016/0038-1098(94)00919-8
Abstract
Porous silicon has been shown to have fractal morphology below a certain length scale. Using low frequency Raman Scattering, we report the fracton dimension d̅ which characterises the vibrational density of states g(ω) ~ ω(d̅-1) of the fractal network. Taking the Hausforff dimension D̅ to be 2.5, the value of d̅ obtained is equal to 1.42±.02, which is close to the theoretically predicted value of 4/3.
| Item Type: | Article |
|---|---|
| Source: | Copyright of this article belongs to Elsevier Science. |
| Keywords: | A. Nanostructures; D. Phonons; E. Inelastic Light Scattering |
| ID Code: | 50213 |
| Deposited On: | 22 Jul 2011 13:45 |
| Last Modified: | 22 Jul 2011 13:45 |
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