Sinha, S. ; Badrinarayanan, S. ; Sinha, A. P. B. (1987) An XPS study of hydrogen implanted zirconium Journal of the Less Common Metals, 134 (2). pp. 229-236. ISSN 0022-5088
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Official URL: http://www.sciencedirect.com/science/article/pii/0...
Related URL: http://dx.doi.org/10.1016/0022-5088(87)90562-5
Abstract
In situ hydrogen ion implantation of polycrystalline zirconium foil was performed and the surface was characterized by X-ray photoelectron spectroscopy (XPS). A thin layer of hydride was produced at the surface. The zirconium 3d level exhibited a chemical shift of 0.9 eV to the high binding energy side, indicating a charge transfer from the metal to the hydrogen. The appearance of a new peak in the XPS valence band spectra at 6 eV, was attributed to a metal-hydrogen bonding band. The decrease in the density of states at the Fermi level correlates well with magnetic susceptibility results. The results are also compared with available literature data on conventionally prepared zirconium hydride.
| Item Type: | Article |
|---|---|
| Source: | Copyright of this article belongs to Elsevier Science. |
| ID Code: | 49003 |
| Deposited On: | 18 Jul 2011 10:12 |
| Last Modified: | 18 Jul 2011 10:12 |
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