Reiter, Günter ; Khanna, Rajesh ; Sharma , Ashutosh (2000) Enhanced instability in thin liquid films by improved compatibility Physical Review Letters, 85 (7). pp. 1432-1435. ISSN 0031-9007
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Official URL: http://prl.aps.org/abstract/PRL/v85/i7/p1432_1
Related URL: http://dx.doi.org/10.1103/PhysRevLett.85.1432
Abstract
We investigated experimentally the morphological evolution of thin polydimethylsiloxane films sandwiched between a silicon wafer and different bounding liquids with interfacial tensions varying by 2 orders of magnitude. It is shown that increasing the compatibility between film and bounding liquid by adding a few surfactant molecules results in a faster instability of shorter characteristic wavelength. Inversely, based on the characteristic parameters describing the instability we determined extremely small interfacial tensions with a remarkable accuracy.
| Item Type: | Article |
|---|---|
| Source: | Copyright of this article belongs to The American Physical Society. |
| ID Code: | 46944 |
| Deposited On: | 06 Jul 2011 10:50 |
| Last Modified: | 06 Jul 2011 10:50 |
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