Tripathi, A. ; Singh, J. P. ; Ahuja, R. ; Dutt, R. N. ; Kanjilal, D. ; Guha, A. ; Biswas, A. ; Raychaudhuri, A. K. (2001) Development of an in situ ultra-high-vacuum scanning tunneling microscope in the beamline of the 15 MV tandem accelerator for studies of surface modification by a swift heavy ion beam Review of Scientific Instruments, 72 (10). pp. 3884-3890. ISSN 0034-6748
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Official URL: http://link.aip.org/link/?RSINAK/72/3884/1
Related URL: http://dx.doi.org/10.1063/1.1405791
Abstract
We report the installation and testing of an ultra-high-vacuum (UHV) scanning tunneling microscope (STM) in the beamline for materials science studies of the 15 MV Pelletron accelerator at the Nuclear Science Center (NSC), New Delhi. This is a new facility for in situ irradiation-induced surface modification studies, available in an accelerator laboratory. The article describes its vibration isolation, in-vacuum sample transfer and other salient features for integrating the STM to the beamline. The UHV STM is tested by obtaining atomically resolved images of highly oriented pyrolytic graphite (HOPG). In situ topographic and spectroscopic studies of defect structures produced by impact of 200 MeV Au ions on HOPG, p-type Si, and 200 MeV Ag-irradiated Y1Ba2Cu3O7+δ are studied.
| Item Type: | Article |
|---|---|
| Source: | Copyright of this article belongs to American Institute of Physics. |
| Keywords: | Scanning Tunnelling Microscopy; Surface Treatment; Ion Beam Effects; Surface Topography; Tandem Accelerators; Ion Accelerators; Vacuum Apparatus; Vibration Isolation; Installation; Scanning Tunnelling Spectroscopy; Graphite; Silicon; Yttrium Compounds; Barium Compounds; High-temperature Superconductors; Elemental Semiconductors; Sample Holders |
| ID Code: | 42663 |
| Deposited On: | 04 Jun 2011 13:50 |
| Last Modified: | 04 Jun 2011 13:50 |
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