Chandrasekharaiah, M. N. ; Ranganathan, S. (1969) Contrast from twin boundaries in field-ion micrographs Journal of Applied Physics, 40 (12). pp. 4835-4836. ISSN 0021-8979
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Official URL: http://jap.aip.org/resource/1/japiau/v40/i12/p4835...
Related URL: http://dx.doi.org/10.1063/1.1657298
Abstract
Computer simulation and geometrical construction have been used to study the contrast from twin boundaries in field-ion micrographs. For specific orientations of the twin boundary, m rings of (hkl) planes in the matrix are expected to match with n rings of (h'k'l) planes in the twin, where m and n are integers and (hkl) and (h'k'l) are prominent planes in the matrix and the twin, respectively.
| Item Type: | Article |
|---|---|
| Source: | Copyright of this article belongs to American Institute of Physics. |
| ID Code: | 41995 |
| Deposited On: | 01 Jun 2011 12:56 |
| Last Modified: | 02 Jun 2011 09:12 |
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