Chandrasekharan, R. ; Srinivasan, R. (1969) On the use of the normalized discrepancy index and other statistical parameters in crystal structure refinement Zeitschrift für Kristallographie, 129 (5-6). pp. 235-250. ISSN 0044-2968
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Official URL: http://www.oldenbourg-link.com/doi/abs/10.1524/zkr...
Related URL: http://dx.doi.org/10.1524/zkri.1969.129.5-6.435
Abstract
The theoretical results concerning the normalized discrepancy index and other statistical parameters such as correlation functions are tested on hypothetical models in projection. Some practical aspects of using these parameters, in particular, the normalized discrepancy index are discussed. Graphical methods have been developed for the estimation of errors in the coordinates of atoms which form only a part of the structure.
| Item Type: | Article |
|---|---|
| Source: | Copyright of this article belongs to Oldenbourg Wissenschaftsverlag. |
| ID Code: | 36702 |
| Deposited On: | 12 Apr 2011 09:37 |
| Last Modified: | 12 Apr 2011 09:37 |
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