Srinivasan, R. ; Vijayalakshmi , B. K. ; Parthasarathy, S. (1974) The use of X-ray anomalous scattering for the detection of small deviations from centrosymmetry Acta Crystallographica Section A, 30 . pp. 535-538. ISSN 0108-7673
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Official URL: http://scripts.iucr.org/cgi-bin/paper?S05677394740...
Related URL: http://dx.doi.org/10.1107/S0567739474001276
Abstract
A quantitative relation is obtained between Bijvoet differences and the deviations from centrosymmetry of a structure. An expression is derived for the root-mean-square value of Δ, where Δ=[I(H)-I(H̅)]/σN2,σN2 =ΣNj=i f2J, in terms of <|Δrj|> and k" where #916;rj are the deviations in atomic coordinates from ideal centrosymmetry, and k"=Δf"/f'. Curves are given connecting r.m.s. Δ with <|ΔrJ|> for a two-dimensional hypothetical model. When <|ΔrJ|> is small the r.m.s. is quite sensitive to <|ΔrJ|> with a moderate anomalous scatterer present in the structure. The behaviour of the Bijvoet ratio is also studied empirically.
Item Type: | Article |
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Source: | Copyright of this article belongs to International Union of Crystallography. |
ID Code: | 36549 |
Deposited On: | 12 Apr 2011 09:39 |
Last Modified: | 12 Apr 2011 09:39 |
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