Rajagopalan, S. R. ; Ramaseshan, S. (1964) Rotating elliptic analysers and automatic analysis of polarised light- Part II Proceedings of the Indian Academy of Sciences, Section A, 60 (6). pp. 379-395. ISSN 0370-899X
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Official URL: http://www.ias.ac.in/j_archive/proca/60/6/379-395/...
Related URL: http://dx.doi.org/10.1007/BF03047419
Abstract
The various main arrangements leading to a few typical rotating elliptie analysers are discussed. Simple devices for the determination of I, M, C, S of completely and partially polarised light beams are given. The possibility of using a rotating elliptic analyser having an electro-optic cell, for the determination of the Stokes parameters of light beams whose state of polarisation is rapidly changing is pointed out. The accuracy of the Stokes parameter method is analysed and it is found that this method leads to λ ρ and ω ρ values which are subject to an error smaller than one minute of arc (intensity measurement accurate to one in ten thousand). Some of the other methods of using the rotating elliptic analysers are also discussed. It is pointed out that the Stokes parameter method and the interference method, using the concept that orthogonal states do not interfere, are the most promising methods for the analyses of polarised light.
Item Type: | Article |
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Source: | Copyright of this article belongs to Indian Academy of Sciences. |
ID Code: | 35177 |
Deposited On: | 17 Apr 2011 14:30 |
Last Modified: | 17 May 2016 18:05 |
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