Reddy, A. K. N. ; Rao, M. G. B. ; Bockris, J. O'M. (1965) Ellipsometric determination of the film thickness and conductivity during the passivation process on nickel Journal of Chemical Physics , 42 (6). pp. 2246-2248. ISSN 0021-9606
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Official URL: http://jcp.aip.org/resource/1/jcpsa6/v42/i6/p2246_...
Related URL: http://dx.doi.org/10.1063/1.1696277
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| Item Type: | Article |
|---|---|
| Source: | Copyright of this article belongs to American Institute of Physics. |
| ID Code: | 34464 |
| Deposited On: | 12 Apr 2011 11:58 |
| Last Modified: | 12 Apr 2011 11:58 |
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