Rao, K. J. M. ; Ramachandra Rao, B. (1965) Determination of the effective life time and transit times of minority carriers in the base region of a transistor Proceedings of the Indian Division of the Institution of Electronic and Radio Engineers, 3 (2). pp. 38-42.
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Official URL: http://ieeexplore.ieee.org/search/freesrchabstract...
Related URL: http://dx.doi.org/10.1049/pidiere.1965.0008
Abstract
Using the experimental set up of Sparkes1 a method of determining the effective life time of minority carriers in the base region of a transistor is presented. The excess base charges are evaluated for different collector currents and from these charges the transit times are evaluated.
Item Type: | Article |
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Source: | Copyright of this article belongs to Institute of Electrical and Electronic Engineers. |
ID Code: | 32960 |
Deposited On: | 21 Mar 2011 13:39 |
Last Modified: | 10 Jun 2011 04:33 |
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