Kumaraswamy, B. V. ; Lal, Ratan ; Narlikar, A. V. (1995) Low-field ac-susceptibility study of flux creep in metal-substituted ErBa2Cu3O7-δ Physical Review B: Condensed Matter and Materials Physics, 52 (2). pp. 1320-1324. ISSN 1550-235X
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Official URL: http://prb.aps.org/abstract/PRB/v52/i2/p1320_1
Related URL: http://dx.doi.org/10.1103/PhysRevB.52.1320
Abstract
Low-field ac-susceptibility studies of pure ErBa2Cu3O7-δ and substituted samples of ErBa2(Cu0.995M0.005)3O7-δ (M=Fe, Co, Ni, Ga) have been carried out in the frequency range up to 1 kHz. The activation energy for flux creep in the case of the doped samples is considerably lower than that for the undoped sample. The analysis of the results within the framework of MÜller’s model [Physica C 159, 717 (1989); 168, 585 (1990)] shows that the intergrain critical current density gets considerably suppressed by the dopants. Employing a SIS junction model it is argued that this can be attributed to the reduction in the Fermi energy of the system due to the localization caused by the presence of the dopant atoms.
| Item Type: | Article |
|---|---|
| Source: | Copyright of this article belongs to The American Physical Society. |
| ID Code: | 32910 |
| Deposited On: | 19 Mar 2011 06:19 |
| Last Modified: | 09 Jun 2011 11:15 |
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