Patel, Ambalal Ranchhodhbhai ; Shivakumar, G. K. (1976) Nucleation, growth and orientation of bismuth films Thin Solid Films, 33 (1). pp. 13-18. ISSN 0040-6090
Full text not available from this repository.
Official URL: http://linkinghub.elsevier.com/retrieve/pii/004060...
Related URL: http://dx.doi.org/10.1016/0040-6090(76)90583-6
Abstract
The nucleation, growth and orientation of bismuth films vapour-deposited onto pure and bismuth-doped sodium chloride cleavages have been studied. The saturation nucleation density of bismuth on both pure and doped cleavages was found to be of the same order, i.e about 3.8×1011cm-2 at 180°C. It was observed that films deposited onto pure sodium chloride cleavages exhibit a (001) orientation whereas those deposited onto bismuth-doped cleavages exhibit a (012) orientation at a substrate temperature of 180°C.
Item Type: | Article |
---|---|
Source: | Copyright of this article belongs to Elsevier Science. |
ID Code: | 32837 |
Deposited On: | 03 May 2011 13:52 |
Last Modified: | 03 May 2011 13:52 |
Repository Staff Only: item control page