On a method for measurement of microwave hall mobility of semiconductors

Nag, B. R. ; Engineer, M. H. (1965) On a method for measurement of microwave hall mobility of semiconductors International Journal of Electronics, 18 (6). pp. 529-535. ISSN 0020-7217

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Related URL: http://dx.doi.org/10.1080/00207216508937787

Abstract

The formula giving the absolute value of microwave Hall mobility in terms of the measured parameters in Hambleton and Gartner's method is derived. It is shown that it is not possible to determine the absolute value of Hall mobility by this method. A modification of the method which eliminates this limitation is suggested.

Item Type:Article
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ID Code:28768
Deposited On:15 Dec 2010 11:35
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