Deb, S. ; Nag, B. R. (1962) Measurement of lifetime of carriers in semiconductors through microwave reflection Journal of Applied Physics, 33 (4). p. 1604. ISSN 0021-8979
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Official URL: http://jap.aip.org/resource/1/japiau/v33/i4/p1604_...
Related URL: http://dx.doi.org/10.1063/1.1728779
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| Item Type: | Article |
|---|---|
| Source: | Copyright of this article belongs to American Institute of Physics. |
| ID Code: | 28615 |
| Deposited On: | 15 Dec 2010 11:49 |
| Last Modified: | 08 Jun 2011 11:24 |
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